2010 Annual Meeting

Session: Process Monitoring and Fault Detection

Latest Advances in Process Monitoring and Fault Detection

Chair

S. Joe Qin, University of Southern California

Co-Chair

Vikas Shukla, ExxonMobil Chemical Company

Presentations

08:30 AM

(615a) An Integrated Fault Diagnosis and Safe-Parking Framework for Fault-Tolerant Control of Nonlinear Process Systems
Miao Du, Prashant Mhaskar

08:50 AM

(615b) Moving Horizon Estimation: Efficient Methods for Fast Implementations
Rodrigo López-Negrete de la Fuente, Lorenz Biegler, Sachin C. Patwardhan

09:10 AM

(615c) Model-Based Fault Detection and Fault-Tolerant Control of Process Systems Using Sampled and Delayed Measurements
Nael H. El-Farra, Yulei Sun

09:30 AM

(615d) Effect of Soft Sensor Dynamics On Process Monitoring
Juergen Hahn, Mitchell Serpas

09:50 AM

(615e) Multivariate Statistical Process Monitoring Based On Statistics Pattern Analysis
Jin Wang, Qinghua He

10:10 AM

(615f) Bayesian Fault Detection and Isolation: Test Results for a Simple Benchmark Problem
Babji Srinivasan, Raghunathan Rengaswamy, Venkat Venkatasubramanian, Craig Rieger, Humberto Garcia, Shankar Narasimhan, Ulaganathan Nallasivam, Kris Villez

10:30 AM

(615g) Branch and Bound Method for Fault Isolation through Missing Variable Analysis
Vinay Kariwala, Pabara-Ebiere Odiowei, Yi Cao, Tao Chen