2008 Annual Meeting

Session: Process Monitoring and Identification

Papers that report novel tools for process monitoring, fault detection and plant identification are solicited.

Chair

Kenneth A. Debelak, Vanderbilt University

Co-Chair

Manish Misra, HOVENSA, LLC

Presentations

08:30 AM

(240a) A Metric for Monitoring Mpc Optimization Strategy
William Canney

08:50 AM

(240b) Computation of Arrival Cost for Moving Horizon Estimation Via Unscented Kalman Filtering
Cheryl C.Y. Qu, Juergen Hahn

09:10 AM

(240c) Nonlinear Stochastic Modeling for State Estimation of An Industrial Polymerization Process
Fernando V. Lima, James B. Rawlings, Tyler Soderstrom

09:30 AM

(240d) Design of Experiments for Identification of Multivariable Models Satisfying Integral Controllability: The Dynamic Model Case
Mark Darby, Michael Nikolaou

09:50 AM

(240e) Cause and Effect Modeling from Plant Data
Derrick Rollins, Swee-Teng Chin, Nidhi Bhandari

10:10 AM

(240f) Data-Driven State and Parameter Estimation Using Bayesian Belief Networks
Ameneh Sahraneshin, Nasir Mehranbod, Reza Eslamlouian, Masoud Soroush

10:30 AM

(240g) Modular Design of Discrete-Time Nonlinear Observers for State and Disturbance Estimation
Costas Kravaris, Georgios Savoglidis