2008 Annual Meeting

Session: Characterization of Engineered Particles and Nano-Structured Particles

The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties

Chair

Bumiller, M., HORIBA Instruments

Co-Chair

Laufer, C. H. N., The Dow Chemical Company