2007 Annual Meeting

Session: Process Monitoring and Fault Detection

Co-Chair

Wang, J., Auburn University

Presentations

08:30 AM

(194a) Fault Detection Using Principal Component Based K-Nearest-Neighbor Rule

08:55 AM

(194b) Multivariate Batch Process Monitoring Utilizing Summary Variables with An Application to Semiconductor Etch
Gallagher, N. B., Wise, B. M., Shaver, J. M., Roginski, R. T., Koch, R. S.

09:20 AM

(194c) Batch Polymerization Monitoring Using Mewa and Mpca
Alvarez, C. R., Asteasuain PIP 0123CO, M., Brandolin, A., Sanchez, M. C.

09:45 AM

(194d) Multivariate Pattern Matching In Fed-Batch Cell Culture
Gunther, J. C., Conner, J. S., Seborg, D. E., Baclaski, J.

10:10 AM

(194e) Wavelet-Genetic Algorithm Based Real-Time Prognosis Of Process Systems
Misra, M., Brewer, J., Watson, M.

10:35 AM

(194f) Comparative Performance Analysis of Alternative Approaches for Gross Error Detection and Identification
Alvarez, C. R., Brandolin, A., Sanchez, M. C.