2007 Annual Meeting

Session: Process Monitoring and Fault Detection

Co-Chair

Jin Wang, Auburn University

Presentations

08:30 AM

(194a) Fault Detection Using Principal Component Based K-Nearest-Neighbor Rule

08:55 AM

(194b) Multivariate Batch Process Monitoring Utilizing Summary Variables with An Application to Semiconductor Etch
Neal B. Gallagher, Barry M. Wise, Jeremy M. Shaver, Robert T. Roginski, R. Scott Koch

09:20 AM

(194c) Batch Polymerization Monitoring Using Mewa and Mpca
Carlos R. Alvarez, Mariano Asteasuain PIP 0123CO, Adriana Brandolin, Mabel C. Sanchez

09:45 AM

(194d) Multivariate Pattern Matching In Fed-Batch Cell Culture
Jon C. Gunther, Jeremy S. Conner, Dale E. Seborg, Jeffrey Baclaski

10:10 AM

(194e) Wavelet-Genetic Algorithm Based Real-Time Prognosis Of Process Systems
Manish Misra, Jeremy Brewer, Mike Watson

10:35 AM

(194f) Comparative Performance Analysis of Alternative Approaches for Gross Error Detection and Identification
Carlos R. Alvarez, Adriana Brandolin, Mabel C. Sanchez