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Proceedings
1989 Loss Prevention Symposium Vol. 23
General Submissions
TECHNICAL PAPERS
An Easy And Inexpensive Approach To DIERS Methodology

Huang, Z. Y.

Authored

(199h) Phase Diagrams, Defect Models and Thermoelectric Properties: ß-Ag2se and CoSb3

2017 Annual Meeting (ISBN: 978-0-8169-1102-8)

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