Skip to main content
Toggle main menu visibility
Menu
Join
Sign In
Communities
Membership
Events
Publications
Learning & Careers
AIChE Home
About
Contact AIChE
Leadership
Events
Communities
Membership
Learning & Careers
Publications
Careers at AIChE
Equity, Diversity, Inclusion
Giving
Students
Young Professionals
Operating councils
Local Sections
Committees
Awards
Communities
Membership
Events
Publications
Learning & Careers
Toggle site search visibility
Sign In
Join
Breadcrumb
Home
Publications
Proceedings
1989 Loss Prevention Symposium Vol. 23
General Submissions
TECHNICAL PAPERS
An Easy And Inexpensive Approach To DIERS Methodology
Chen, Y. Y.
Authored
(199h) Phase Diagrams, Defect Models and Thermoelectric Properties: ß-Ag2se and CoSb3
2017 Annual Meeting (ISBN: 978-0-8169-1102-8)
Related Proceedings
2017 Annual Meeting
