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Proceedings
1989 Loss Prevention Symposium Vol. 23
General Submissions
TECHNICAL PAPERS
An Easy And Inexpensive Approach To DIERS Methodology
Kim, N. Y.
Authored
(380w) Machine Learning Determination of Resistant and Tolerant Bacteria Growth Modes Induced By Nanoparticles
2019 AIChE Annual Meeting (ISBN: 978-0-8169-1112-7)
Related Proceedings
2019 AIChE Annual Meeting
