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Proceedings
1989 Loss Prevention Symposium Vol. 23
General Submissions
TECHNICAL PAPERS
An Easy And Inexpensive Approach To DIERS Methodology
Elam, J. W.
Authored
(360d) Industrializing Atomic Layer Deposition for Upgraded Catalysts: Scale-up Perspectives
2019 AIChE Annual Meeting (ISBN: 978-0-8169-1112-7)
Related Proceedings
2019 AIChE Annual Meeting
