Overcoming The Limitations Of Today’s Particle Characterization Technology

Static Light Scattering (Laser Diffraction), Dynamic Light Scattering, and Dynamic Image Analysis have been applied to the characterization of particles for over 40 years. Each method has limitations for particle size range, particle concentration, and sample preparation. This presentation will explain the theoretical basis for these limitations and will also describe the criteria for choosing the appropriate method for characterizing various applications.