(605c) Measurement Model for Interpretation of Impedance Spectra

The measurement model, developed in our group the 1990s with the collaboration of Prof Luis Garcia-Rubio,[1] provides a means to assess the stochastic and bias error of impedance measurements. This concept was recently published in a computer program that allows both quantification of stochastic and bias errors and regression of user-defined interpretation models.[2] The program is made available under the GNU General Public License (GPL) 3.0 that makes it free for non-commercial use.

Our philosophy is that interpretation of impedance spectroscopy data requires both a physical insight into the chemistry and physics that govern the system under investigation and an assessment of the error structure of the measurement. The application of the measurement model is presented for the impedance data collected on sputtered iridium oxide electrodes designed for neural stimulation[3] and dielectric spectroscopy data in the form of complex frequency-dependent relative permittivity. The measurement model concept is general and may be applied for a wide variety of transfer-function measurements.

[1] P. Agarwal, M. E. Orazem, and L. H. García-Rubio, “Measurement Models for Electrochemical Impedance Spectroscopy: 1. Demonstration of Applicability,” Journal of The Electrochemical Society, 139 (1992), 1917-1927.

[2] W. Watson and M. E. Orazem, EIS: Measurement Model Program, Version 1.8, ECSArXiv, 2023, https://doi.org/10.1149/osf.io/g2fjm.

[3] H. M. Lutz, Y. Wu, C. C. Eluagu, S. F. Cogan, K. J. Otto, and M. E. Orazem, “Analysis of Electrochemical Impedance Spectroscopy Data for Sputtered Iridium Oxide Electrodes,” Journal of Neural Engineering, 22 (2025), 036007.