Investigating Polymer Morphology Using Serial Block-Face Scanning Electron Microscopy

Serial Block-Face Scanning Electron Microscopy (SBF-SEM) is a relatively recent innovation in the field of electron microscopy, offering the ability to perform 3-D reconstruction of materials with nanometer resolution. This makes SBF-SEM a valuable imaging technique for investigating the morphology found throughout a polymeric material, revealing intricate structures like phase separations commonly studied in polymer science, which are critical in determining the physical properties of materials.

Alongside minimal sample preparation, SBF-SEM’s ability to automate the serial sectioning and imaging process enables the achievement of large imaging volumes that would have otherwise consisted of a long and drawn-out preparation process. Before the development of SBF-SEM, samples needed to be prepared using an Automatic Tape-collecting Ultra-Microtome (ATUM) to be then observed under an SEM. If a Transmission Electron Microscope (TEM) is employed, ultra-thin sectioned samples are also required, which calls for complex preparation protocols. On the other hand, SBF-SEM uses an in-chamber ultramicrotome equipped with a diamond knife, allowing serial sectioning and imaging to be done through automated procedures.

This poster underlines the application of SBF-SEM to polymer analysis and its interdisciplinary utility, especially in the fields of material and biological sciences. Technical aspects, such as sample preparation challenges, will also be discussed. By leveraging the high-resolution 3-D imaging power that SBF-SEM provides, a deeper understanding of the micro and nanostructures that dictate polymer properties can be achieved, paving the way for developing more advanced materials.