2017 Annual Meeting

Session: Process Monitoring & Fault Detection

This session seeks novel contributions in the broad areas of process monitoring, fault detection, isolation, estimation and accommodation in process systems. Both data-driven and model-based approaches are welcome. Applications to industrial processes are encouraged.

Chair

Jeevan Maddala, West Virginia University

Co-Chair

Yuncheng Du, Clarkson University

Presentations

03:15 PM

(625a) Distributed Fault Diagnosis for Networked Nonlinear Uncertain Systems
Hadi Shahnazari, Prashant Mhaskar

03:32 PM

(625b) A Multi-Sensor Error Detection and Functional Redundancy Algorithm for Dynamic Systems
Jianyuan Feng, Iman Hajizadeh, Ali Cinar, Sediqeh Samadi, Mert Sevil, Nicole Frantz, Caterina Lazaro, Zacharie Maloney, Xia Yu, Elizabeth Littlejohn, Laurie Quinn

03:49 PM

(625c) Model-Based Fault Detection for Nonlinear Process Systems Using Multiparametric Programing for Parameter Estimation
Ernie Che Mid, Vivek Dua

04:06 PM

(625d) Event Detection and Estimation of Its Influence Based on Fuzzy Qualitative Representation of Measurements and Fuzzy Logic Estimator
Sediqeh Samadi, Kamuran Turksoy, Iman Hajizadeh, Jianyuan Feng, Mert Sevil, Ali Cinar

04:23 PM

(625e) Fault Detection and Diagnosis of Continuous Processes Via Non-Linear Support Vector Machine Based Feature Selection
Melis Onel, Chris A. Kieslich, Yannis A. Guzman, Christodoulos A. Floudas, Efstratios Pistikopoulos

04:40 PM

(625f) Optimal Test Design Framework for Model-Based Active Fault Detection and Isolation
Kyle A. Palmer, George Bollas

04:57 PM

(625g) Verification of Control Systems with Discrete and Continuous Dynamics
B. Erik Ydstie, Chintan Bhomia, Blake C. Rawlings

05:14 PM

(625h) Multi-Rate Sampled-Data Observer Design for Nonlinear Systems with Multiple Measurement Delays
Chen Ling, Costas Kravaris

05:31 PM

(625i) Data Reconciliation with Inequality Constraints Induces Bias: A Cause for Concern?
Kris Villez