The electrochemical CO
2 reduction reaction has the potential to produce industrial chemicals and to mitigate the increasing CO
2 concentrations in the atmosphere. Polycrystalline copper, the only transition metal catalyst to produce hydrocarbons at reasonable Faradaic efficiency, produces a reasonable 1mA/cm
2 current density at ~1V overpotential.
1 Polycrystalline Cu has shown similar onset potentials for C
1 and C
2 hydrocarbons at -0.75V vs. RHE
2, suggesting both C
1 and C
2 pathways to be limited by the initial hydrogenation of *CO to form *CHO. However, the (100) facet and nanostructured Cu have been shown to have an earlier onset for C
2 products in alkaline conditions.
4-7 These results suggest a C-C coupling pathway that proceeds prior to *CO hydrogenation. Recent calculations have found CO-CO coupling to be feasible in the presence of a solvent and cation, which induces a field in the Helmholtz plane.
8 We present a DFT study on the effect of coverage, strain, and electric field on CO-CO coupling energetics on Cu (100), (111), and (211). Our calculations indicate that CO-CO coupling is facile on all three facets in the presence of a cation-induced electric field in the Helmholtz plane, with the lowest barrier on Cu(100). The CO dimerization pathway is therefore expected to play a role in C
2 formation at potentials negative of the Cu potential of zero charge, corresponding to CO
2/CO reduction conditions at high pH. Both increased *CO coverage and tensile strain further improve C-C coupling energetics on Cu (111) and (211). Since CO dimerization is facile on all 3 Cu facets, subsequent surface hydrogenation steps may also play an important role in determining the overall activity towards C
2 products. Adsorption of *CO, *H, and *OH on the 3 facets were investigated with a Pourbaix analysis. The (211) facet has the largest propensity to co-adsorb *CO and *H, which would favor surface hydrogenation following CO dimerization. These results suggest that the (100) and (211) facets should be the most active due to field and coverage effects.
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