2013 AIChE Annual Meeting

(216c) Stability and Flocculation Behavior of Silica Microparticles in Ionic Micellar Solutions

Authors

Walz, J. Y., Virginia Tech



Using the technique of colloid probe atomic force microscopy (CP-AFM), measurements of the equilibrium depletion force between a silica particle and a flat silica plate in solutions of tetradecyltrimethylammonium bromide (C14TAB) and sodium dodecyl sulfate (SDS) at varying concentrations were performed. With increasing surfactant concentration, the onset of a depletion well and structural forces was observed implying the possibility of depletion induced flocculation or stabilization in dispersions of colloidal silica. The force versus separation curves obtained through CP-AFM were converted into energy versus separation curves and the stability ratio analysis described by Marmur (J. Colloid Interface Sci. 1979, 72, 41-48.) was used to predict the stability behavior of colloidal silica dispersed in ionic micellar solutions.  Comparisons are drawn between the stability ratio analysis and photographic analysis and ultraviolet-visible (UV-VIS) light spectroscopy results for the stability of dispersions of 0.5 μm colloidal silica particles in solutions of C14TAB and SDS at varying concentrations.