Skip to main content
Toggle main menu visibility
Menu
Join
Sign In
Communities
Membership
Events
Publications
Learning & Careers
AIChE Home
About
Contact AIChE
Leadership
Events
Communities
Membership
Learning & Careers
Publications
Careers at AIChE
Equity, Diversity, Inclusion
Giving
Students
Young Professionals
Operating councils
Local Sections
Committees
Awards
Communities
Membership
Events
Publications
Learning & Careers
Toggle site search visibility
Sign In
Join
Breadcrumb
Home
Publications
Proceedings
CCPS 17th Annual International Conference and Workshop Risk, Reliability, and Security
General Submissions
TECHNICAL PAPERS
Selective Catalytic Reduction (SCR) System Design and Operations: Quantitative Risk Analysis of Options
2011 Annual Meeting
Session: Oxide Materials: Synthesis, Characterization, and Application
Co-Chair
Ekerdt, J.
, University of Texas-Austin
Presentations
03:15 PM
(604a) Engineering AlN Thin Films by Atomic Layer Deposition On Wide Bandgap Semiconductors As Gate Dielectric
03:40 PM
(604b) Atomic Layer Deposition and Characterization of ErxTi1-XOy Films
04:05 PM
(604c) Engineering LixAlySizO Ionic Conductive Thin Films by Atomic Layer Deposition for Lithium-Ion Battery Applications
04:30 PM
(604d) Engineered Multiferroic PZT-CFO and BFO-CFO Thin Films for Large Magnetoelectric Coefficient by Atomic Layer Deposition
04:55 PM
(604e) Control of Oxygen Self-Diffusion In Metal Oxides for Nanoelectronics
05:20 PM
(604f) MBE Growth of Fe3O4 and Fe2O3 for Both Spin Injection Layers and Templates for Spinel Complex Oxides
