Breadcrumb
- Home
- Publications
- Proceedings
- 2011 Annual Meeting
- Separations Division
- PAT for Crystallization Development and Manufacturing
- (548b) Enhanced Resolution for More Accurate Inline Particle Measurements In Crystallization
Paradigm shifts in signal processing have dramatically improved the resolution and accuracy of in situ particle size (chord length) measurements and advanced optics has dramatically enhanced the count linearity with increasing concentrations.
Examples will be presented where the Next Generation FBRM® technology is used to
- Enhance sensitivity to secondary nucleation
- Improve nucleation and growth kinetics calculations
- Detect probe fouling and measure crystal distributions in an inherently fouling processing
- Improve correlations with downstream process efficiency and product quality