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- (245e) Interfacial Nanomechanics In Atomic Force Microscopy of Complex Polymer-Surfactant Thin Films
Atomic force microscopy (AFM), while long used for simple topographic imaging of solid surfaces in many industrial R&D labs, has the simultaneous ability to interrogate tribological response functions of organic thin films. Alternatively the microcantilever to which the AFM imaging tip is attached can be vertically vibrated in such a way that weak van der Waals attractive forces enable non-contact imaging of liquidy film domains or droplets. Here liquid versus solid behaviors are assessed domain by domain across the film in non-contact and intermittent-contact imaging modes, the latter in a quasistatic variant called digital pulsed force mode, D-PFM (also known as peak-force tapping). Moreover frictional response is probed while sliding the same nanoasperity continuously across/through the film domains. Vertical displacement of the asperity is measured during this dynamic shear process to assess fly height. Subsequent imaging of the same domains in non-contact assesses changes produced by the preceding tribological experiment. Force-distance relationships during the pulling of tip away from film provide further glimpses into solid-like versus liquid-like behaviors (“wicking”). In D-PFM these behaviors are mapped at high point density to provide a rich data cube.
In this work we present results of all of the above measurement/imaging modes on complex thin films deposited from an aqueous gel phase of polydimethylsiloxane, n-alkyl ammonium chloride surfactant and fatty alcohol onto mica substrates. Velocity-dependent sliding further characterizes the nanorheological performance of different phase segregated film domains.