2010 Annual Meeting

Session: PAT for Crystallization Development and Manufacturing

This session welcomes presentations on recent applications of Process Analytical Technologies (PAT) for development and manufacturing of crystallization processes. PAT applications may include various spectroscopy (FTIR, NIR, Raman), particle size and counting techniques (FBRM, PVM), and other on-line or in-line monitoring or sensing techniques. Novel approaches and methodologies to drive crystallization development are of particular interest.

Chair

Levente L. Simon, ETH Zurich

Co-Chair

Jean W. Tom, Bristol-Myers Squibb

Presentations

03:15 PM

(355a) Real-Time Monitoring of Nucleation and Growth Rates in An Industrial Semi-Batch Sugar Crystallizer
Terry P. Redman, Greg Golovanoff, Wayne Genck

03:35 PM

(355c) Apply PAT to the Definition of Design Space to Enable the Control Strategy for Crystallization Processes
George Zhou, Aaron Moment, Angela Spartalis, Sean Harrington, Shane Grosser, Marguerite Mohan, Naijun Wu, Ganeshwar Prasad, Tseng-En Hu, Paul Fernandez, John Higgins

04:00 PM

(355d) Automated Crystallization Platform: Integrating Hardware, Software, and PAT to Expedite the Process of Crystallization Development
Amanda Rogers, Jacob Albrecht, James Vernille, Jose Tabora, Francesco Ricci, Mitsuko Fujiwara, Richard D. Braatz

04:15 PM

(355e) Characterization of Flash Crystallization Process Using PAT
Barbara Wood, Brian Glennon

04:35 PM

(355f) Crystallization Scale-up with Process Analytical Technologies – Ensuring Success From the R&D Lab to the Manufacturing Plant
Terry P. Redman, Ben Smith, Des O'Grady

04:55 PM

(355g) Direct Measurement of Length and Orientation of Microfibers in Solution
Taslima Khanam, Nurur Rahman Mohammad, Arvind Rajendran, Vinay Kariwala, Anand K. Asundi