2010 Annual Meeting

Session: PAT for Crystallization Development and Manufacturing

This session welcomes presentations on recent applications of Process Analytical Technologies (PAT) for development and manufacturing of crystallization processes. PAT applications may include various spectroscopy (FTIR, NIR, Raman), particle size and counting techniques (FBRM, PVM), and other on-line or in-line monitoring or sensing techniques. Novel approaches and methodologies to drive crystallization development are of particular interest.

Chair

Simon, L. L., ETH Zurich

Co-Chair

Tom, J. W., Bristol-Myers Squibb