2010 Annual Meeting
Session: PAT for Crystallization Development and Manufacturing
This session welcomes presentations on recent applications of Process Analytical Technologies (PAT) for development and manufacturing of crystallization processes. PAT applications may include various spectroscopy (FTIR, NIR, Raman), particle size and counting techniques (FBRM, PVM), and other on-line or in-line monitoring or sensing techniques. Novel approaches and methodologies to drive crystallization development are of particular interest.
Chair
Simon, L. L., ETH Zurich
Co-Chair
Tom, J. W., Bristol-Myers Squibb