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Publications
Proceedings
CCPS 17th Annual International Conference and Workshop Risk, Reliability, and Security
General Submissions
TECHNICAL PAPERS
Selective Catalytic Reduction (SCR) System Design and Operations: Quantitative Risk Analysis of Options
2009 Annual Meeting
Session: Semiconductor Surface Chemistry
Presentations
03:15 PM
(168a) Particle Adhesion in Microelectronics Processing
03:40 PM
(168b) RHEED-TRAXS Development for Real Time, in-Situ Stoichiometry Analysis During Thin Film Deposition
04:05 PM
(168c) Defect Engineering for Ultra-Shallow Junctions Using Solid-Solid Interfaces
04:30 PM
(168d) Chemical Mechanisms of Interface Degradation Between Barium Hexaferrite Thin Films On Wide Bandgap 6H-SiC
