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Proceedings
2007 Annual Meeting
Nanoscale Science and Engineering Forum
Nanoelectronic Materials
(488g) Multiresolution Image Characterization Of Line Edge Roughness Using Wave Cluster Technique
2007 Annual Meeting
(488g) Multiresolution Image Characterization Of Line Edge Roughness Using Wave Cluster Technique
Authors
A. Palazoglu - Presenter
, UC Davis
Rajib Mukherjee - Presenter
, Louisiana State University
