2006 AIChE Annual Meeting

Session: Interfacial Phenomena in Conducting and Semiconducting Systems

The session welcomes both experimental and theoretical work concerning all aspects of electronic manufacturing where interfacial phenomena play an enabling role. The general areas of interest (but not limited) are cleaning, chemical mechanical polishing (CMP), metrology, lithography, surface modification, chemical vapor deposition (CVD). Both fundamental and applied works are highly encouraged.

Chair

Sundaram, S., Rohm & Haas Company

Co-Chair

Truskett, V. N., Molecular Imprints, Inc.