2006 AIChE Annual Meeting
Session: Characterization of Engineered Particles and Nano-Structured Particles
The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties
08:30 AM
Weizhi Rong, Weiqiang Ding, Lutz Maedler, Rodney Ruoff, S. K. Friedlander
08:55 AM
Amit S. Kulkarni, Gregory Beaucage, Hendrik K. Kammler, Sotiris E. Pratsinis
09:20 AM
Jan Dirk Epping, Mia G. Berrettini, Christina Raab, Almut Rapp, Jeff Gerbec, Geoffrey F. Strouse, Bradley F. Chmelka
09:45 AM
Victoria L. Calero, Carlos Rinaldi
10:10 AM
Jonghoon Choi, Vytas Reipa, Nam Sun Wang
10:35 AM
Marcos Llusa, Fernando J. Muzzio