2006 AIChE Annual Meeting

Session: Characterization of Engineered Particles and Nano-Structured Particles

The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties

Chair

Gregory Beaucage, University of Cincinnati

Co-Chair

Mark Bumiller, Malvern Instruments

Presentations

08:30 AM

08:55 AM

Amit S. Kulkarni, Gregory Beaucage, Hendrik K. Kammler, Sotiris E. Pratsinis

09:20 AM

Jan Dirk Epping, Mia G. Berrettini, Christina Raab, Almut Rapp, Jeff Gerbec, Geoffrey F. Strouse, Bradley F. Chmelka

09:45 AM

10:10 AM

Jonghoon Choi, Vytas Reipa, Nam Sun Wang

10:35 AM