2006 AIChE Annual Meeting
(398b) An Investigation into Gallium Arsenide Thin Film Growth: Molecular Dynamics Simulation
Authors
Until recently, all of the empirical potentials used to study GaAs/InAs systems were fit to bulk properties alone. A new parameterization has recently been developed which was fit to surface geometries and energies of the GaAs (001) and InAs (001) surfaces, including the β2(2x4) and α(2x4) reconstructions, as well as bulk lattice constants and cohesive energies1. We have performed a number of studies aimed at validating this potential. Using NPT MD, we studied the thermal properties and melting of bulk GaAs. We determined the bulk melting point, the isothermal compressibility, and the coefficient of thermal expansion. The potential closely matches experimental densities as the temperature increases, but it underestimates the bulk melting point and overestimates the coefficient of thermal expansion as well as the isothermal compressibility. We also utilized MD to probe the stability of the GaAs(001)β2(2x4) reconstruction against melting.
To probe diffusion and the preferred Ga-atom binding sites, we calculated the minimum potential-energy surface (PES), using conjugate-gradient energy minimization for a gallium atom on the GaAs (001) β2(2x4) reconstruction. We also evaluated various diffusion pathways and energy barriers using the nudged elastic band method. The empirical potential captures the deepest minima and the diffusion barriers from the map compare favorably to first-principles DFT results. 1. T. Hammerschmidt, P. Kratzer, and M. Scheffler, to be published.